Growth temperature effects on the microstructure of Nb-doped BaTiO_(3) thin films of the composition BaTi_(0.98)Nb_(0.02)O_(3) are studied using X-ray diffraction and transmission electron microscopy(TEM).Reciprocal s...Growth temperature effects on the microstructure of Nb-doped BaTiO_(3) thin films of the composition BaTi_(0.98)Nb_(0.02)O_(3) are studied using X-ray diffraction and transmission electron microscopy(TEM).Reciprocal space maps and electron diffraction patterns show that the a-axis lattice parameter increases and the c-axis parameter decreases with increasing growth temperature,indicating a decrease of tetragonality.Bright-field TEM images show low and high densities of threading defects in films grown at low and high temperatures,respectively.The observations are discussed in terms of a hindering of the cubic-to-tetragonal phase transition by a high defect density and a high unit cell volume.展开更多
基金supported by the Korea Research Council of Fundamental Science and Technology(KRCF)through a Basic Research Project managed by the Korea Research Institute of Standards and Science(KRISS)Support was also given by the Natural Science Foundation of China(Grant No.61271127).
文摘Growth temperature effects on the microstructure of Nb-doped BaTiO_(3) thin films of the composition BaTi_(0.98)Nb_(0.02)O_(3) are studied using X-ray diffraction and transmission electron microscopy(TEM).Reciprocal space maps and electron diffraction patterns show that the a-axis lattice parameter increases and the c-axis parameter decreases with increasing growth temperature,indicating a decrease of tetragonality.Bright-field TEM images show low and high densities of threading defects in films grown at low and high temperatures,respectively.The observations are discussed in terms of a hindering of the cubic-to-tetragonal phase transition by a high defect density and a high unit cell volume.
