in this paper ,based on the butlt-in self-test technique to logic circuil ,a nme approach is pro-posed to optimize input probability of digital circuit. After the worst faults are found and their circuitmodel are crea...in this paper ,based on the butlt-in self-test technique to logic circuil ,a nme approach is pro-posed to optimize input probability of digital circuit. After the worst faults are found and their circuitmodel are created the output signals of these models will be compressed by “1” counter. Fault detectprobabilities for the worst faults can be obtained by analyzing compact data. Finally, using the relationbetween the input probability and the fault detect probabilily ,we propose a new algorithm to optimzethe primary input probainlily of the circuit. So the shortest test length can he received.展开更多
文摘in this paper ,based on the butlt-in self-test technique to logic circuil ,a nme approach is pro-posed to optimize input probability of digital circuit. After the worst faults are found and their circuitmodel are created the output signals of these models will be compressed by “1” counter. Fault detectprobabilities for the worst faults can be obtained by analyzing compact data. Finally, using the relationbetween the input probability and the fault detect probabilily ,we propose a new algorithm to optimzethe primary input probainlily of the circuit. So the shortest test length can he received.
