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Fabrication of Nanoscale Active Plasmonic Elements Using Atomic Force Microscope Tip-Based Nanomachining
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作者 Ciaran Barron Silas O'Toole dominic zerulla 《Nanomanufacturing and Metrology》 EI 2022年第1期50-59,共10页
Atomic force microscopy(AFM)is a widely adopted imaging and surface analysis technique that provides resolutions on the nanometer scale.AFM tip-based nanomachining has recently been adopted for the fabrication of arbi... Atomic force microscopy(AFM)is a widely adopted imaging and surface analysis technique that provides resolutions on the nanometer scale.AFM tip-based nanomachining has recently been adopted for the fabrication of arbitrarily shaped nanoscale structures.A major challenge of using AFM tip-based machining for the sculpting of nanoscale plasmonic structures is the build-up of displaced material along the sides of the channels.Here we apply this nanomechanical machining method to create active plasmonic elements and present the strategy we have been using to avoid the formation of such debris.Furthermore,a number of post-manufacturing treatments that can potentially be used to reduce the amount of debris surrounding the fabricated structures are discussed. 展开更多
关键词 Nanomechanical machining Nanoscale fabrication PLASMONICS Atomic force microscope AFM
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