Multiply charged ions of Ar and NO were observed in MPI experiment Of NO/Ar with TOF-MS. A delayable pulsed acceleration field wn applied tO investigate the effect of the photoelectrons on the formation of the multi...Multiply charged ions of Ar and NO were observed in MPI experiment Of NO/Ar with TOF-MS. A delayable pulsed acceleration field wn applied tO investigate the effect of the photoelectrons on the formation of the multiply charged ions. The multiply charged ions were suggested to be produced by photoelectron impact ionization, in the region bentween the extractor grid and the repeller plate, step by step, from neutral species and lower charged ions. The 50-60ns of FWHM of the ion peaks implies that the pulse width of the photoelectrons should be shorter considering the broadening effect during the ionization process.展开更多
文摘Multiply charged ions of Ar and NO were observed in MPI experiment Of NO/Ar with TOF-MS. A delayable pulsed acceleration field wn applied tO investigate the effect of the photoelectrons on the formation of the multiply charged ions. The multiply charged ions were suggested to be produced by photoelectron impact ionization, in the region bentween the extractor grid and the repeller plate, step by step, from neutral species and lower charged ions. The 50-60ns of FWHM of the ion peaks implies that the pulse width of the photoelectrons should be shorter considering the broadening effect during the ionization process.