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Laser Induced Photoelectron Impact Ionization In Multiphoton Ionization Process
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作者 Li WANG Hai Yang LI +3 位作者 Ji Ling BAI dong xu dai Ju Long SUN Ri Chang LU (State Key Laboratory of Molecular Reaction Dynamics, Dalian Institute of Chemical Physics,Chinese Academy of Sciences, Dalian,116023) 《Chinese Chemical Letters》 SCIE CAS CSCD 1997年第11期0-0,0-0,共4页
Multiply charged ions of Ar and NO were observed in MPI experiment Of NO/Ar with TOF-MS. A delayable pulsed acceleration field wn applied tO investigate the effect of the photoelectrons on the formation of the multi... Multiply charged ions of Ar and NO were observed in MPI experiment Of NO/Ar with TOF-MS. A delayable pulsed acceleration field wn applied tO investigate the effect of the photoelectrons on the formation of the multiply charged ions. The multiply charged ions were suggested to be produced by photoelectron impact ionization, in the region bentween the extractor grid and the repeller plate, step by step, from neutral species and lower charged ions. The 50-60ns of FWHM of the ion peaks implies that the pulse width of the photoelectrons should be shorter considering the broadening effect during the ionization process. 展开更多
关键词 308 REV Laser Induced Photoelectron Impact Ionization In Multiphoton Ionization Process
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