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Scanning electrochemical microscopy-development of instrumentation utilizing piezo-bimorph X-Y scanners
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作者 MAO, BW MU, JQ +5 位作者 ZHUO, XD feng, zd YAN, ER PAN, GB XIE, ZX REN, B 《Chinese Journal of Chemistry》 SCIE CAS CSCD 1995年第2期105-111,共7页
The development of the instrumentation of a scanning electrochemical microscopy (SECM) is presented. The core of the SECM sensing system is constructed based on piezo-bimorph scanners, a mechanical micropositioner of ... The development of the instrumentation of a scanning electrochemical microscopy (SECM) is presented. The core of the SECM sensing system is constructed based on piezo-bimorph scanners, a mechanical micropositioner of multi-dimensional adjustment and ultramicroelectrodes. The control of the electrochemical cell and the SECM system is realized by a battery powered bipoteniostat and analog control circuits respectively with the control of a microcomputer work station. The demonstrations of SECM experiments are given on both a standard IDA sample and a silver electrode. Discussions on the resolution and quality of SECM image are made. 展开更多
关键词 SCANNING ELECTROCHEMICAL MICROSCOPY PIEZO-BIMORPH ULTRAMICROELECTRODE
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