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Interface reactions in film materials
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作者 fengwu zhu, zhonghai thai, and guanghua yumaterials science and engineering school, university of science and technology beijing, beijing 100083, china 《Journal of University of Science and Technology Beijing》 CSCD 2003年第5期1-8,共8页
Interface reaction (IR) is a frequently observed phenomenon in the study ofadvanced thin film materials. It is very important to study the reaction conditions at which IRhappens and then to suppress or make use of it,... Interface reaction (IR) is a frequently observed phenomenon in the study ofadvanced thin film materials. It is very important to study the reaction conditions at which IRhappens and then to suppress or make use of it, the necessary conditions, including boththermodynamical and dynamical conditions of IR were discussed in detail. IRs in various systems,including oxide/silicon, oxide/metal, metal/metal, metal/semiconductor andsemiconductor/semiconductor, were reviewed. Methods to suppress and make use of IR were alsointroduced. 展开更多
关键词 interface reaction spin-valve multilayers gate dielectric
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