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Effects of Nitridation Temperature on Characteristics of Gallium Nitride Thin Films Prepared Via Two-Step Method
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作者 Chee Yong fong Sha Shiong Ng +2 位作者 fong kwong yam Haslan Abu Hassan Zainuriah Hassan 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 2015年第3期362-366,共5页
In this research,the growth of GaN thin films on c-plane sapphire(0001) substrates via two-step method without the assist of buffer layer and catalysts was demonstrated.First,gallium oxide(Ga_2O_3) thin films were... In this research,the growth of GaN thin films on c-plane sapphire(0001) substrates via two-step method without the assist of buffer layer and catalysts was demonstrated.First,gallium oxide(Ga_2O_3) thin films were deposited on sapphire substrates by radio frequency magnetron sputtering method.The deposited Ga_2O_3 thin films were then nitridated at various temperatures.In this research,attention is focused on the influence of nitridation temperatures on the structural and optical properties of the synthesized GaN thin films.It is revealed that 950 ℃ is the optimal nitridation temperature for synthesizing hexagonal wurtzite GaN thin film with preferential(0002) growth direction. 展开更多
关键词 Sputtering Nitridation Gallium oxide Gallium nitride
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