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360-nm Photoluminescence from Silicon Oxide Films Embedded with Silicon Nanocrystals 被引量:1
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作者 YANG Lin-lin guo heng-qun +1 位作者 ZENG You-hua WANG Qi-ming 《Semiconductor Photonics and Technology》 CAS 2006年第2期90-94,共5页
Si-rich silicon oxide films were deposited by RF magnetron sputtering onto composite Si/SiO2 targets. After annealed at different temperature, the silicon oxide films embedded with silicon nanocrystals were obtained. ... Si-rich silicon oxide films were deposited by RF magnetron sputtering onto composite Si/SiO2 targets. After annealed at different temperature, the silicon oxide films embedded with silicon nanocrystals were obtained. The photoluminescenee(PL) from the silicon oxide films embedded with silicon nanocrystals was observed at room temperature. The strong peak is at 360 nm, its position is independent of the annealing temperature. The origin of the 360-nm PL in the silicon oxide films embedded with silicon nanoerystals was discussed. 展开更多
关键词 RF magnetron sputtering Silicon nanocrystals PL
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