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Occurrence of Features of Fiber Bragg Grating Spectra Having a Wavelength Corresponding to the Phase Mask Periodicity
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作者 Sui P. Yam Zourab Brodzeli +2 位作者 Scott A. wade greg w. baxter Stephen F. Collins 《Journal of Electronic Science and Technology of China》 2008年第4期458-461,共4页
The use of a phase mask with 536 nm uniform pitch allowed the fabrication of a fiber Bragg grating for use at a Bragg wavelength of 785 nm. Reflection and transmission features at 1552 nm, twice the Bragg wavelength, ... The use of a phase mask with 536 nm uniform pitch allowed the fabrication of a fiber Bragg grating for use at a Bragg wavelength of 785 nm. Reflection and transmission features at 1552 nm, twice the Bragg wavelength, associated with the phase mask periodicity were observed. However, when phase mask orders other than +1 were absent during fabrication the features at 1552 nm were not evident. 展开更多
关键词 Double of the Bragg wavelength fiber Bragg grating phase mask Talbot interferometer.
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