To deal with the invalidation of commonly employed series model and parallel model in capacitance-voltage(C-V)characterization of organic thin films when current injection is significant,a three-element equivalent cir...To deal with the invalidation of commonly employed series model and parallel model in capacitance-voltage(C-V)characterization of organic thin films when current injection is significant,a three-element equivalent circuit model is proposed.On this basis,the expression of real capacitance in consideration of current injection is theoretically derived by small-signal analysis method.The validity of the proposed equivalent circuit and theoretical expression are verified by a simulating circuit consisting of a capacitor,a diode,and a resistor.Moreover,the accurate C-V characteristic of an organic thin film device is obtained via theoretical correction of the experimental measuring result,and the real capacitance is 35.7%higher than the directly measured capacitance at 5-V bias in the parallel mode.This work strongly demonstrates the necessity to consider current injection in C-V measurement and provides a strategy for accurate C-V characterization experimentally.展开更多
基金Project supported by the National Natural Science Foundation of China(Grant Nos.11874007 and 12074076).
文摘To deal with the invalidation of commonly employed series model and parallel model in capacitance-voltage(C-V)characterization of organic thin films when current injection is significant,a three-element equivalent circuit model is proposed.On this basis,the expression of real capacitance in consideration of current injection is theoretically derived by small-signal analysis method.The validity of the proposed equivalent circuit and theoretical expression are verified by a simulating circuit consisting of a capacitor,a diode,and a resistor.Moreover,the accurate C-V characteristic of an organic thin film device is obtained via theoretical correction of the experimental measuring result,and the real capacitance is 35.7%higher than the directly measured capacitance at 5-V bias in the parallel mode.This work strongly demonstrates the necessity to consider current injection in C-V measurement and provides a strategy for accurate C-V characterization experimentally.
