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Fano Resonance Enabled Infrared Nano-Imaging of Local Strain in Bilayer Graphene 被引量:2
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作者 Jing Du Bosai Lyu +11 位作者 Wanfei Shan Jiajun Chen Xianliang Zho u Jingxu xie Aolin Deng Cheng Hu Qi Liang guibai xie Xiaojun Li Weidong Luo Zhiwen Shi 《Chinese Physics Letters》 SCIE CAS CSCD 2021年第5期60-66,共7页
Detection of local strain at the nanometer scale with high sensitivity remains challenging.Here we report near-field infrared nano-imaging of local strains in bilayer graphene by probing strain-induced shifts of phono... Detection of local strain at the nanometer scale with high sensitivity remains challenging.Here we report near-field infrared nano-imaging of local strains in bilayer graphene by probing strain-induced shifts of phonon frequency.As a non-polar crystal,intrinsic bilayer graphene possesses little infrared response at its transverse optical phonon frequency.The reported optical detection of local strain is enabled by applying a vertical electrical field that breaks the symmetry of the two graphene layers and introduces finite electrical dipole moment to graphene phonon.The activated phonon further interacts with continuum electronic transitions,and generates a strong Fano resonance.The resulted Fano resonance features a very sharp near-field infrared scattering peak,which leads to an extraordinary sensitivity of-0.002%for the strain detection.Our results demonstrate the first nano-scale near-field Fano resonance,provide a new way to probe local strains with high sensitivity in non-polar crystals,and open exciting possibilities for studying strain-induced rich phenomena. 展开更多
关键词 RED image Fano Resonance Enabled Infrared Nano-Imaging of Local Strain in Bilayer Graphene
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Fabrication of high-quality all-graphene devices with low contact resistances 被引量:2
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作者 Rong Yang Shuang Wu +7 位作者 Duoming Wang guibai xie Meng Cheng Guole Wang Wei Yang Peng Chen Dongxia Shi Guangyu Zhang 《Nano Research》 SCIE EI CAS CSCD 2014年第10期1449-1456,共8页
All-graphene devices are new class of graphene devices with simple layouts and low contact resistances. Here we report a clean fabrication strategy for all-graphene devices via a defect-assisted anisotropic etching. T... All-graphene devices are new class of graphene devices with simple layouts and low contact resistances. Here we report a clean fabrication strategy for all-graphene devices via a defect-assisted anisotropic etching. The as-fabricated graphene is free of contamination and retains the quality of pristine graphene. The contact resistance at room temperature (RT) between a bilayer graphene channel and a multilayer graphene electrode can be as low as -5 Ω.·μm, the lowest ever achieved experimentally. Our results suggest the feasibility of employing such all-graphene devices in high performance carbon-based integrated circuits. 展开更多
关键词 GRAPHENE all-graphene devices THINNING contact resistance
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