Influence of Zr(50)Cu(50) thin film metallic glass as buffer layer on the structural and optoelectrical properties of AZO films

Aluminum-doped ZnO(AZO) thin films with thin film metallic glass of Zr(50)Cu(50) as buffer are prepared on glass substrates by the pulsed laser deposition. The influence of buffer thickness and substrate temperature on structural, optical, and electrical properties of AZO thin film are investigated. Increasing the thickness of buffer layer and substrate temperature can both promote the transformation of AZO from amorphous to crystalline structure, while they show(100)and(002) unique preferential orientations, respectively. After inserting Zr(50)Cu(50) layer between the glass substrate and AZO film, the sheet resistance and visible transmittance decrease, but the infrared transmittance increases. With substrate temperature increasing from 25℃ to 520℃, the sheet resistance of AZO(100 nm)/Zr(50)Cu(50)(4 nm) film first increases and then decreases, and the infrared transmittance is improved. The AZO(100 nm)/Zr(50)Cu(50)(4 nm) film deposited at a substrate temperature of 360℃ exhibits a low sheet resistance of 26.7 ?/, high transmittance of 82.1% in the visible light region, 81.6% in near-infrared region, and low surface roughness of 0.85 nm, which are useful properties for their potential applications in tandem solar cell and infrared technology.

Research on Key Technologies of Detecting 1553B Avionics Data Bus Network

1553B avionics data bus network may fail due to vibration,temperature,humidity or human error.Therefore,the research on detection technology of 1553B avionics data bus network is an important subject.The key technologies are studied by analyzing the possible faults of the network,including four-wire DC resistance measurement method for conductors-to-shield short test and stub continuity test,equivalent impedance measurement of coupling transformer for main bus continuity test,polarity reversal test base on duty ratio measurement,attenuation measurement base on coupler model,and data path integrity test base on bit error rate calculation.Finally,the implementation methods of key technologies are researched,a portable integrated automatic test system of 1553B data bus network is constructed based on PC 104 computer,and the hardware configuration and test process are especially designed.