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Elimination of bistability in constant-phase mode in atomic force microscopy
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作者 LI YingZi QIAN JianQiang +3 位作者 LI XiaoFeng LI Yuan hua b aocheng YAO-JunEn 《Chinese Science Bulletin》 SCIE CAS 2012年第5期460-465,共6页
By presenting the phase properties of bistability in amplitude-modulation atomic force microscopy, we put forward a technique, the constant-phase mode, which may eliminate bistability. Using this approach, we keep the... By presenting the phase properties of bistability in amplitude-modulation atomic force microscopy, we put forward a technique, the constant-phase mode, which may eliminate bistability. Using this approach, we keep the phase shift between driving and oscillation constant, slightly above -90°. In addition to the adjustment of the free amplitude, we add to amplitude-modulation atomic force microscopy another feedback so that the tip always oscillates in the high-amplitude state. A numerical simulation is carried out to demonstrate that the algorithm prevents bistability effectively. 展开更多
关键词 原子力显微镜 双稳态 定阶 相位特性 驾驶执照 数值模拟 相模式 高振幅
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