The selection of circuit model（i.e., parallel or series model） is critical when using a capacitance–frequency and capacitance–voltage technique to probe properties of organic materials and physical processes of or...The selection of circuit model（i.e., parallel or series model） is critical when using a capacitance–frequency and capacitance–voltage technique to probe properties of organic materials and physical processes of organic optoelectronic devices. In the present work, capacitances of ITO/Alq3/Al and ITO/CuPc/Al are characterized by series and parallel model,respectively. It is found that the large series resistance comes from the ITO electrode and results in the inapplicability of the parallel model to measuring the capacitances of organic devices at high frequencies. An equivalent circuit model with consideration of the parasitical inductance of cables is constructed to derive the capacitance, and actual capacitance–frequency spectra of Alq3 and CuPc devices are obtained. Further investigation of temperature-dependent capacitance–frequency and capacitance–voltage characteristics indicates that CuPc and Al form the Schottky contact, the density and ionization energy of impurities in CuPc are obtained. Moreover, more practical guidelines for accurate capacitance measurement are introduced instead of the impedance magnitude, which will be very helpful for the organic community to investigate capacitance-related characteristics when dealing with various organic optoelectronic devices.展开更多
To deal with the invalidation of commonly employed series model and parallel model in capacitance-voltage(C-V)characterization of organic thin films when current injection is significant,a three-element equivalent cir...To deal with the invalidation of commonly employed series model and parallel model in capacitance-voltage(C-V)characterization of organic thin films when current injection is significant,a three-element equivalent circuit model is proposed.On this basis,the expression of real capacitance in consideration of current injection is theoretically derived by small-signal analysis method.The validity of the proposed equivalent circuit and theoretical expression are verified by a simulating circuit consisting of a capacitor,a diode,and a resistor.Moreover,the accurate C-V characteristic of an organic thin film device is obtained via theoretical correction of the experimental measuring result,and the real capacitance is 35.7%higher than the directly measured capacitance at 5-V bias in the parallel mode.This work strongly demonstrates the necessity to consider current injection in C-V measurement and provides a strategy for accurate C-V characterization experimentally.展开更多
基金supported by the Fundamental Research Funds for the Central Universities,China
文摘The selection of circuit model（i.e., parallel or series model） is critical when using a capacitance–frequency and capacitance–voltage technique to probe properties of organic materials and physical processes of organic optoelectronic devices. In the present work, capacitances of ITO/Alq3/Al and ITO/CuPc/Al are characterized by series and parallel model,respectively. It is found that the large series resistance comes from the ITO electrode and results in the inapplicability of the parallel model to measuring the capacitances of organic devices at high frequencies. An equivalent circuit model with consideration of the parasitical inductance of cables is constructed to derive the capacitance, and actual capacitance–frequency spectra of Alq3 and CuPc devices are obtained. Further investigation of temperature-dependent capacitance–frequency and capacitance–voltage characteristics indicates that CuPc and Al form the Schottky contact, the density and ionization energy of impurities in CuPc are obtained. Moreover, more practical guidelines for accurate capacitance measurement are introduced instead of the impedance magnitude, which will be very helpful for the organic community to investigate capacitance-related characteristics when dealing with various organic optoelectronic devices.
基金Project supported by the National Natural Science Foundation of China(Grant Nos.11874007 and 12074076).
文摘To deal with the invalidation of commonly employed series model and parallel model in capacitance-voltage(C-V)characterization of organic thin films when current injection is significant,a three-element equivalent circuit model is proposed.On this basis,the expression of real capacitance in consideration of current injection is theoretically derived by small-signal analysis method.The validity of the proposed equivalent circuit and theoretical expression are verified by a simulating circuit consisting of a capacitor,a diode,and a resistor.Moreover,the accurate C-V characteristic of an organic thin film device is obtained via theoretical correction of the experimental measuring result,and the real capacitance is 35.7%higher than the directly measured capacitance at 5-V bias in the parallel mode.This work strongly demonstrates the necessity to consider current injection in C-V measurement and provides a strategy for accurate C-V characterization experimentally.
