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Solution-processed amorphous gallium-tin oxide thin film for low-voltage, high-performance transistors 被引量:2
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作者 Jinhua Ren Kaiwen Li +5 位作者 Jianwen Yang Dong Lin haoqing kang Jingjing Shao Ruofan Fu Qun Zhang 《Science China Materials》 SCIE EI CSCD 2019年第6期803-812,共10页
Gallium-tin oxide(GTO) semiconductor thin films were prepared by spin-coating with 2-methoxyethanol as the solvent. Their crystal structures, optical transparency,chemical states and surface morphologies, along with t... Gallium-tin oxide(GTO) semiconductor thin films were prepared by spin-coating with 2-methoxyethanol as the solvent. Their crystal structures, optical transparency,chemical states and surface morphologies, along with the electrical properties, were dependent on Ga contents and annealing temperatures. The optimized GTO channel layer was applied in the high-k Al2O3 thin film transistor(TFT) with a low operation voltage of 2 V, a maximum field-effect mobility of 69 cm^2 V^-1 s^-1, a subthreshold swing(SS) of 76 mV dec^-1, a threshold voltage of 0.67 V and an on-off current ratio of 1.8×10^7. The solution-processed amorphousGTO-TFTs would promote the development of low-consumption, low-cost and high performance In-free TFT devices. 展开更多
关键词 GTO semiconductor films thin-film transistor stability Al2O3 dielectric
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