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Development of Triticum aestivume——Leymus mollis Translocation Lines and Identification of Resistance to Stripe Rust 被引量:2
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作者 haoxun li Renchun Fan +7 位作者 Shulan Fu Bo Wei Shichang Xu Jing Feng Qi Zheng Xianping Wang Fangpu Han Xiangqi Zhang 《Journal of Genetics and Genomics》 SCIE CAS CSCD 2015年第3期129-132,共4页
Wheat stripe rust, caused by Puccinia striiformis f. sp. tritici, is one of the most widely distributed and destructive fungal diseases worldwide. Since 1995, most Chinese wheat cultivars have lost their stripe rust r... Wheat stripe rust, caused by Puccinia striiformis f. sp. tritici, is one of the most widely distributed and destructive fungal diseases worldwide. Since 1995, most Chinese wheat cultivars have lost their stripe rust resistance due to the subsequent emergence of the new races CYR30, CYR31, CYR32, and CYR33 (Han et al., 2010). Therefore, it is necessary to seek effective resistance genes and develop new resistance germ- plasm for wheat resistance breeding. 展开更多
关键词 Leymus mollis Translocation Lines and Identification of Resistance to Stripe Rust Development of Triticum aestivume line FISH GISH
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