Family selection and evaluation of Larix gmelinii var.principis-rupprechtii(Mayr.)Pilger based on stem analysis data at multiple sites

Larix gmelinii var.principis-rupprechtii(Mayr.)Pilger is an important native tree species in North China with advantages of fast growth,straight trunk,and good wood properties.The multi-year and multi-site breeding research of families of the species has not been reported previously.Based on diameter at breast height(DBH),height and volume of 25 families on four experimental sites,we calculated variance components,genetic parameters,juvenile and mature trait correlations and made genotype main effect plus genotype×environment interaction effect(GGE)biplot based on the breeding values estimated using the method of best linear unbiased prediction(BLUP).Compared with height,DBH and volume had higher heritability and larger variation coefficients,making them the more suitable traits for family selection and evaluation.Based on these,GGE biplots containing 20 combinations of site×age were drawn using data at 13 to 17 years when the interactions between family and location were strong.Test sites classifications based on DBH,and volume were inconsistent,with two categories for DBH and one for volume.The Guyuan site was the most suitable with strong discriminating ability,high representativeness and stability among tree ages.Integrating the ranking results of DBH and volume,families 66,76,82 and 111 were high-yielding and stable,families 78 and96 were high-yielding with above average stability,families72 and 79 were high-yielding with below average stability,whereas stability of family 100 was inconsistent between DBH and volume.Early selection based on DBH was convenient and reliable,and can be made at seven years.This study provides support for the selection of Larix gmelinii var.principis-rupprechtii families in Hebei province and an example for the application of stem analysis data from multiple sites in tree breeding.

Application profiles of integrated circuits in various industry fields

Integrated circuits play an increasingly important role in various fields.The aging effects,which lead to robustness problems in integrated circuits,has gained more attention.Therefore,during the design process the robustness problem must already be calculated.Generally,the time-dependent influences such as NBTI(negative bias temperature instability)and HCI(hot carrier injection)contribute to circuit aging problems[1].