A comprehensive experimental and numerical study of solder joints for plastic leaded chip carrier (PLCC) 84-Pin,1.27 mm pitch was carried out. The reliability of solder joints was assessed through accelerated thermal ...A comprehensive experimental and numerical study of solder joints for plastic leaded chip carrier (PLCC) 84-Pin,1.27 mm pitch was carried out. The reliability of solder joints was assessed through accelerated thermal cycling at the temperature range of -55℃～125℃. The samples were taken out to observe the evolution in microstructure, such as grain coarsening, initiation and propagation of cracks. It was found that the Pb-rich phases segregated gradually and formed a continuous layer adjacent to the intermetallic compound (IMC) layer with increasing the number of thermal cycles, resulting in cracks near the solder/lead interface. The response of stress and strain was studied using nonlinear finite element method (FEM), and the results agreed well with the experimental data.展开更多
文摘A comprehensive experimental and numerical study of solder joints for plastic leaded chip carrier (PLCC) 84-Pin,1.27 mm pitch was carried out. The reliability of solder joints was assessed through accelerated thermal cycling at the temperature range of -55℃～125℃. The samples were taken out to observe the evolution in microstructure, such as grain coarsening, initiation and propagation of cracks. It was found that the Pb-rich phases segregated gradually and formed a continuous layer adjacent to the intermetallic compound (IMC) layer with increasing the number of thermal cycles, resulting in cracks near the solder/lead interface. The response of stress and strain was studied using nonlinear finite element method (FEM), and the results agreed well with the experimental data.
