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LabVIEW and PCI DAQ Card Based HTS Test and Control Platforms 被引量:2
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作者 hui-bin zhao jian-xun jin pu-chun jiang wen-hui gao zi-lu liang 《Journal of Electronic Science and Technology of China》 2008年第2期198-204,共7页
This paper introduces the relevant parameters and related characteristics of the LabVIEW and PCI6221 data acquisition (DAQ) card, describes in detail the approach of building the measure and control platform of virt... This paper introduces the relevant parameters and related characteristics of the LabVIEW and PCI6221 data acquisition (DAQ) card, describes in detail the approach of building the measure and control platform of virtual instrument (VI) using LabVIEW and PCI6221, specifically discusses the system's application in high temperature superconductor (HTS) research including the test of HTS volt-ampere characteristics and the HTS magnetic energy storage. The experiments prove that the VI test and control system is easy to build and convenient to use. 展开更多
关键词 Data acquisition (DAQ) high temperature superconductor (HTS) HTS device HTSI-V measurement virtual instrument (VI).
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