Process Capability Analysis (PCA) is a powerful too l to assess the ability of a process for manufacturing product that meets specific ations. The larger process capability index implies the higher process yield, a nd...Process Capability Analysis (PCA) is a powerful too l to assess the ability of a process for manufacturing product that meets specific ations. The larger process capability index implies the higher process yield, a nd the larger process capability index also indicates the lower process expected loss. Chen et al. (2001) has applied indices C pu, C pl, and C pk for evaluating the process capability for a multi-process product wi th smaller-the-better, larger-the-better, and nominal-the-best specificati ons respectively. However, C pk cannot reasonably reflect the process expected loss. In this paper, index C pn is selected to replace C pk. Indices C pu, C pl, and C pn are used to evalu ate the entire process capability for a multi-process product with smaller-the -better, larger-the-better, and nominal-the-best specifications respectivel y. An integrated process capability index for a multi-process product is propo sed. The relationship between process capability index and the process yield is introduced. A multi-process capability analysis chart (MPCAC), reasonably rev ealing the status of process capability for the entire product, is constructed f or practical application. An evaluating procedure of the process capability for the entire product is also provided.展开更多
文摘Process Capability Analysis (PCA) is a powerful too l to assess the ability of a process for manufacturing product that meets specific ations. The larger process capability index implies the higher process yield, a nd the larger process capability index also indicates the lower process expected loss. Chen et al. (2001) has applied indices C pu, C pl, and C pk for evaluating the process capability for a multi-process product wi th smaller-the-better, larger-the-better, and nominal-the-best specificati ons respectively. However, C pk cannot reasonably reflect the process expected loss. In this paper, index C pn is selected to replace C pk. Indices C pu, C pl, and C pn are used to evalu ate the entire process capability for a multi-process product with smaller-the -better, larger-the-better, and nominal-the-best specifications respectivel y. An integrated process capability index for a multi-process product is propo sed. The relationship between process capability index and the process yield is introduced. A multi-process capability analysis chart (MPCAC), reasonably rev ealing the status of process capability for the entire product, is constructed f or practical application. An evaluating procedure of the process capability for the entire product is also provided.
