Generation of lossy mode resonances(LMR)using perovskite nanofilms

The results presented here show for the first time the experimental demonstration of the fabrication of lossy mode resonance(LMR) devices based on perovskite coatings deposited on planar waveguides. Perovskite thin films have been obtained by means of the spin coating technique and their presence was confirmed by ellipsometry, scanning electron microscopy, and X-ray diffraction testing. The LMRs can be generated in a wide wavelength range and the experimental results agree with the theoretical simulations. Overall, this study highlights the potential of perovskite thin films for the development of novel LMR-based devices that can be used for environmental monitoring, industrial sensing, and gas detection, among other applications.

All-fiber ellipsometer for nanoscale dielectric coatings

Multiple mode resonance shifts in tilted fiber Bragg gratings(TFBGs)are used to simultaneously measure the thickness and the refractive index of TiO_(2) thin films formed by Atomic Layer Deposition(ALD)on optical fibers.This is achieved by comparing the experimental wavelength shifts of 8 TFBG resonances during the deposition process with simulated shifts from a range of thicknesses(T)and values of the real part of the refractive index(n).The minimization of an error function computed for each(n,T)pair then provides a solution for the thickness and refractive index of the deposited film and,a posteriori,to verify the deposition rate throughout the process from the time evolution of the wavelength shift data.Validations of the results were carried out with a conventional ellipsometer on flat witness samples deposited simultaneously with the fiber and with scanning electron measurements on cut pieces of the fiber itself.The final values obtained by the TFBG(n=2.25,final thickness of 185 nm)were both within 4%of the validation measurements.This approach provides a method to measure the formation of nanoscale dielectric coatings on fibers in situ for applications that require precise thicknesses and refractive indices,such as the optical fiber sensor field.Furthermore,the TFBG can also be used as a process monitor for deposition on other substrates for deposition methods that produce uniform coatings on dissimilar shaped substrates,such as ALD.