期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
Measurement of D(d,p)T Reaction Cross Sections in Sm Metal in Low Energy Region (10 ≤ Ed ≤20 keV)
1
作者 王铁山 杨振 +5 位作者 H. Yunemura A. Nakagawa 吕会议 陈建勇 刘盛进 j. kasagi 《Chinese Physics Letters》 SCIE CAS CSCD 2007年第11期3103-3106,共4页
To study the screening effect of nuclear reactions in metallic environments, the thick target yields, the cross sections and the experimental S(E) factors of the D(d, p)T reaction have been measured on deuterons i... To study the screening effect of nuclear reactions in metallic environments, the thick target yields, the cross sections and the experimental S(E) factors of the D(d, p)T reaction have been measured on deuterons implanted in Sm metal at 133.2K for beam energies ranging from 10 to 20 ke V. The thick target yields of protons emitted in the D(d, p)T reaction are measured and compared with those data extrapolated from cross sections and stopping power data at higher energies. The screening potential in Sm metal at 133.2K is deduced to be 520±56eV. As compared with the value achieved in the gas target, the calculated screening potential values are much larger. This screening potential cannot be simply interpreted only by the electron screening. Energy dependences of the cross section σ(E) and the experimental S(E) factor for D(d,p)T reaction in Sm metal at 133.2K are obtained, respectively. 展开更多
关键词 coated conductor buffer layer self-epitaxy CEO2
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部