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Characterization of the ZnO thin film prepared by single source chemical vapor deposition under low vacuum condition 被引量:8
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作者 邓宏 B.GONG +2 位作者 A.J.Petrella j.j.russell R.N.Lamb 《Science China(Technological Sciences)》 SCIE EI CAS 2003年第4期355-360,共6页
A novel technique is developed for growing high quality ZnO thin films by means of single source chemical vapor deposition (SS CVD) under low vacuum conditions with the precursor of zinc carbamate Zn4O(CO2Net2)6. SEM,... A novel technique is developed for growing high quality ZnO thin films by means of single source chemical vapor deposition (SS CVD) under low vacuum conditions with the precursor of zinc carbamate Zn4O(CO2Net2)6. SEM, AFM and XRD studies show that the resultant thin films have high density, smooth surface, uniform polycrystalline structure and excellent c-axis orientation. XPS investigation indicates that the ZnO films are free of decomposed precursor residues in the bulk. Careful quantitative XPS analysis reveals that the ZnO films are stoichiometric with O/Zn atomic ratio very close to that of ZnO single crystal. 展开更多
关键词 ZnO THIN film low VACUUM deposition SSCVD.
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