期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
SILICON MICRO-TRENCH ETCHING USING HIGH-DENSITY PLASMA ETCHER
1
作者 T.T.Sun Z.G.Liu +2 位作者 H.C.Yu M.B.Chen j.m.miao 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 2005年第3期397-402,共6页
Dry etching of silicon is an essential process step for the fabrication of Micro electromechancal system (MEMS). The AZ7220 positive photo-resist was used as the etching mask and silicon micro-trenches were fabricated... Dry etching of silicon is an essential process step for the fabrication of Micro electromechancal system (MEMS). The AZ7220 positive photo-resist was used as the etching mask and silicon micro-trenches were fabricated with a multiplexed indu ctively coupled plasma (ICP) etcher. The influence of resist pattern profile, an d etch condition on sidewall roughness were investigated detail. The results sho w that the sidewall roughness of micro-trench depends on profiles of photo-resis t pattern, the initial interface between the resist bottom surface and silicon s urface heavily. The relationship between roughness and process optimization para meters are presented in the paper. The roughness of the sidewall has been decrea sed to a 20-50nm with this experiment. 展开更多
关键词 deep RIE silicon etching micro-trench photo-resist
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部