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Spectroellipsometric Study of Lead Lanthanum Zirconate Titanate Amorphous Ferroelectric-Like Thin Films
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作者 LI Qiu-jun ZHU De-rui +2 位作者 MO Dang XU Yu-huan jdmackenzie 《Chinese Physics Letters》 SCIE CAS CSCD 1998年第8期600-602,共3页
Lead lanthanum zirconate titanate(PLZT)amorphous thin films whose composition is stoichiometric 9/65/35 have been grown and they show some wonderful ferroelectric-like properties.The ellipsometric spectra of the PLZT ... Lead lanthanum zirconate titanate(PLZT)amorphous thin films whose composition is stoichiometric 9/65/35 have been grown and they show some wonderful ferroelectric-like properties.The ellipsometric spectra of the PLZT ferroelectric-like amorphous films have been obtained by a homemade automatic ellipsometer in the wave-length range of 200-700nm,and their optical constant(refractive index n and extinction coefficient k)spectra have been determined.As the photon energy changes from 1.9 to 5.8eV,the refractive index n of the PLZT amorphous films increases from 2.13 to 2.46,then decreases to 1.45.The absorption edge of the PLZT amorphous films is about 300nm,while that of the transparent ceramics with the same composition is about 377nm. 展开更多
关键词 properties. AMORPHOUS FERROELECTRIC
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