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Parameter Test of ROIC for IRFPA Based on Virtual Instrument Technology
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作者 jia gong xian, yuan xiang hui, huang you shu, lu guo lin (school of photoelectric eng., chongqing university, chongqing 400044, chn) 《Semiconductor Photonics and Technology》 CAS 2001年第3期150-154,162,共6页
The readout integrated circuit (ROIC) technology is one of the critical technologies in the research of an infrared focal plane array (IRFPA). Based on the virtual instrument technology, a system for parameter test of... The readout integrated circuit (ROIC) technology is one of the critical technologies in the research of an infrared focal plane array (IRFPA). Based on the virtual instrument technology, a system for parameter test of ROIC is developed for IRFPA. The complex programmable logic device (CPLD) is applied into the system to increase its flexibility. With high reliability and precision, along with the integrated software and hardware environment, the system can test all kinds of ROICs. 展开更多
关键词 虚拟仪器 读出集成电路 复杂可编程逻辑器 红外焦平面列车
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