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Interface Reconstruction Study by Functional Scanning Probe Microscope in Li-ion Battery Research 被引量:1
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作者 jia lang-lang JI Yu-Chen +3 位作者 YANG Kai WANG Zi-jian CHEN Hai-Biao PAN Feng 《Chinese Journal of Structural Chemistry》 SCIE CAS CSCD 2020年第2期200-205,183,共7页
Interfacial reaction is a critical factor of lithium ion battery, but is also complicated and difficult to characterize. Scanning probe microscope(SPM) is one of the most effective tools to reveal the interface recons... Interfacial reaction is a critical factor of lithium ion battery, but is also complicated and difficult to characterize. Scanning probe microscope(SPM) is one of the most effective tools to reveal the interface reconstruction and interfacial properties(including the morphologies, mechanical properties and electricity properties) of energy material at nanoscale and at real time. In this paper, we briefly summarized the principles of AFM, conductive AFM(C-AFM) and Kelvin probe force microscope(KPFM), as well as their application to investigate the interface reconstruction of lithium-ion battery electrode material. 展开更多
关键词 SPM AFM KPFM C-AFM BATTERY
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