Non-destructive and accurate inspection of gallium nitride light-emitting diode(Ga N-LED)epitaxial wafers is important to Ga N-LED technology.However,the conventional electroluminescence inspection,the photoluminescen...Non-destructive and accurate inspection of gallium nitride light-emitting diode(Ga N-LED)epitaxial wafers is important to Ga N-LED technology.However,the conventional electroluminescence inspection,the photoluminescence inspection,and the automated optical inspection cannot fulfill the complex technical requirements.In this work,an inspection method and an operation system based on soft single-contact operation,namely,single-contact electroluminescence(SC-EL)inspection,are proposed.The key component of the SC-EL inspection system is a soft conductive probe with an optical fiber inside,and an AC voltage(70Vpp,100 k Hz)is applied between the probe and the ITO electrode under the LED epitaxial wafer.The proposed SC-EL inspection can measure both the electrical and optical parameters of the LED epitaxial wafer at the same time,while not causing mechanical damage to the LED epitaxial wafer.Moreover,it is demonstrated that the SC-EL inspection has a higher electroluminescence wavelength accuracy than photoluminescence inspection.The results show that the non-uniformity of SC-EL inspection is 444.64%,which is much lower than that of photoluminescence inspection.In addition,the obtained electrical parameters from SC-EL can reflect the reverse leakage current(Is)level of the LED epitaxial wafer.The proposed SC-EL inspection can ensure high inspection accuracy without causing damage to the LED epitaxial wafer,which holds promising application in LED technology.展开更多
Manganese dioxide(MnO_(2)),as a cathode material for multivalent ion(such as Mg^(2+)and Al^(3+))storage,is investigated due to its high initial capacity.However,during multivalent ion insertion/extraction,the crystal ...Manganese dioxide(MnO_(2)),as a cathode material for multivalent ion(such as Mg^(2+)and Al^(3+))storage,is investigated due to its high initial capacity.However,during multivalent ion insertion/extraction,the crystal structure of MnO_(2)partially collapses,leading to fast capacity decay in few charge/discharge cycles.Here,through pre-intercalating potassium-ion(K+)intoδ-MnO_(2),we synthesize a potassium ion pre-intercalated MnO_(2),K_(0.21)MnO_(2)·0.31H_(2)O(KMO),as a reliable cathode material for multivalent ion batteries.The as-prepared KMO exhibits a high reversible capacity of 185 mAh/g at 1 A/g,with considerable rate performance and improved cycling stability in 1 mol/L MgSO_(4)electrolyte.In addition,we observe that aluminum-ion(Al^(3+))can also insert into a KMO cathode.This work provides a valid method for modifcation of manganesebased oxides for aqueous multivalent ion batteries.展开更多
基金National Key Research and Development Program of China(2021YFB3600400)Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China(2020ZZ113)。
文摘Non-destructive and accurate inspection of gallium nitride light-emitting diode(Ga N-LED)epitaxial wafers is important to Ga N-LED technology.However,the conventional electroluminescence inspection,the photoluminescence inspection,and the automated optical inspection cannot fulfill the complex technical requirements.In this work,an inspection method and an operation system based on soft single-contact operation,namely,single-contact electroluminescence(SC-EL)inspection,are proposed.The key component of the SC-EL inspection system is a soft conductive probe with an optical fiber inside,and an AC voltage(70Vpp,100 k Hz)is applied between the probe and the ITO electrode under the LED epitaxial wafer.The proposed SC-EL inspection can measure both the electrical and optical parameters of the LED epitaxial wafer at the same time,while not causing mechanical damage to the LED epitaxial wafer.Moreover,it is demonstrated that the SC-EL inspection has a higher electroluminescence wavelength accuracy than photoluminescence inspection.The results show that the non-uniformity of SC-EL inspection is 444.64%,which is much lower than that of photoluminescence inspection.In addition,the obtained electrical parameters from SC-EL can reflect the reverse leakage current(Is)level of the LED epitaxial wafer.The proposed SC-EL inspection can ensure high inspection accuracy without causing damage to the LED epitaxial wafer,which holds promising application in LED technology.
基金supported by the National Natural Science Foundation of China(Grant No.52102264)the Leading Edge Technology of Jiangsu Province(BK20220009)the Open Project Program of Wuhan National Laboratory for Optoelectronics(No.2020WNLOKF011).
文摘Manganese dioxide(MnO_(2)),as a cathode material for multivalent ion(such as Mg^(2+)and Al^(3+))storage,is investigated due to its high initial capacity.However,during multivalent ion insertion/extraction,the crystal structure of MnO_(2)partially collapses,leading to fast capacity decay in few charge/discharge cycles.Here,through pre-intercalating potassium-ion(K+)intoδ-MnO_(2),we synthesize a potassium ion pre-intercalated MnO_(2),K_(0.21)MnO_(2)·0.31H_(2)O(KMO),as a reliable cathode material for multivalent ion batteries.The as-prepared KMO exhibits a high reversible capacity of 185 mAh/g at 1 A/g,with considerable rate performance and improved cycling stability in 1 mol/L MgSO_(4)electrolyte.In addition,we observe that aluminum-ion(Al^(3+))can also insert into a KMO cathode.This work provides a valid method for modifcation of manganesebased oxides for aqueous multivalent ion batteries.