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Large Curved Surface Measurement
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作者 WANGJin-jiang jinsu-kun 《Semiconductor Photonics and Technology》 CAS 2002年第1期46-50,共5页
The measurement principle of large curved surface through theodolite industry survey system is introduced. Two methods are suggested with respect to the distribution range of curved surface error. The experiments show... The measurement principle of large curved surface through theodolite industry survey system is introduced. Two methods are suggested with respect to the distribution range of curved surface error. The experiments show that the measurement precision can be up to 0.15 mm with relative precision of 3×10 -5 . Finally, something needed paying attention to and the application aspects on theodolite industry survey system are given. 展开更多
关键词 large curved surface ERROR tehodolite
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