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Continuous wafer-scale graphene on cubic-SiC(O01)
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作者 Alexander N. Chaika Olga V. Molodtsova +5 位作者 Alexei A. Zakharov Dmitry Marchenko jaime sanchez-barrig Andrei Varykhalov Igor V. Shvets Victor Yu. Aristov 《Nano Research》 SCIE EI CAS CSCD 2013年第8期562-570,共9页
The atomic and electronic structure of graphene synthesized on commercially available cubic-SiC(001)/Si(001) wafers have been studied by low energy electron microscopy (LEEM), scanning tunneling microscopy (STM... The atomic and electronic structure of graphene synthesized on commercially available cubic-SiC(001)/Si(001) wafers have been studied by low energy electron microscopy (LEEM), scanning tunneling microscopy (STM), low energy electron diffraction (LEED), and angle resolved photoelectron spectroscopy (ARPES). LEEM and STM data prove the wafer-scale continuity and uniform thickness of the graphene overlayer on SIC(001). LEEM, STM and ARPES studies reveal that the graphene overlayer on SIC(001) consists of only a few monolayers with physical properties of quasi-freestanding graphene. Atomically resolved STM and micro-LEED data show that the top graphene layer consists of nanometer-sized domains with four different lattice orientations connected through the 〈110〉-directed boundaries. ARPES studies reveal the typical electron spectrum of graphene with the Dirac points close to the Fermi level. Thus, the use of technologically relevant SiC(001)/Si(001) wafers for graphene fabrication repre-sents a realistic way of bridging the gap between the outstanding properties of graphene and their applications. 展开更多
关键词 GRAPHENE cubic-SiC(001) STM ARPES LEEM LEED
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