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E®ect of light polariztion on pattern illumination super-resolution imaging
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作者 Caimin Qiu jianling chen +3 位作者 Zexian Hou Chaoxian Xu Shusen Xie Hongqin Yang 《Journal of Innovative Optical Health Sciences》 SCIE EI CAS 2016年第3期71-78,共8页
Far-¯eld°uorescence microscopy has made great progress in the spatial resolution,limited by light diffraction,since the super-resolution imaging technology appeared.And stimulated emission depletion(STED)mic... Far-¯eld°uorescence microscopy has made great progress in the spatial resolution,limited by light diffraction,since the super-resolution imaging technology appeared.And stimulated emission depletion(STED)microscopy and structured illumination microscopy(SIM)can be grouped into one class of the super-resolution imaging technology,which use pattern illumination strategy to circumvent the di®raction limit.We simulated the images of the beads of SIM imaging,the intensity distribution of STED excitation light and depletion light in order to observe effects of the polarized light on imaging quality.Compared to¯xed linear polarization,circularly polarized light is more suitable for SIM on reconstructed image.And right-handed circular polarization(CP)light is more appropriate for both the excitation and depletion light in STED system.Therefore the right-handed CP light would be the best candidate when the SIM and STED are combined into one microscope.Good understanding of the polarization will provide a reference for the patterned illumination experiment to achieve better resolution and better image quality. 展开更多
关键词 Structured illumination microscopy stimulated emission depletion microscopy polarized light di®raction limit
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Structured illumination microscopy and its new developments
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作者 jianling chen Caimin Qiu +3 位作者 Minghai You Xiaogang chen Hongqin Yang Shusen Xie 《Journal of Innovative Optical Health Sciences》 SCIE EI CAS 2016年第3期63-70,共8页
Optical microscopy allows us to observe the biological structures and processes within living cells.However,the spatial resolution of the optical microscopy is limited to about half of the wavelength by the light di&#... Optical microscopy allows us to observe the biological structures and processes within living cells.However,the spatial resolution of the optical microscopy is limited to about half of the wavelength by the light di®raction.Structured illumination microscopy(SIM),a type of new emerging super-resolution microscopy,doubles the spatial resolution by illuminating the specimen with a patterned light,and the sample and light source requirements of SIM are not as strict as the other super-resolution microscopy.In addition,SIM is easier to combine with the other imaging techniques to improve their imaging resolution,leading to the developments of diverse types of SIM.SIM has great potential to meet the various requirements of living cells imaging.Here,we review the recent developments of SIM and its combination with other imaging techniques. 展开更多
关键词 Structured illumination microscopy diffraction limit SUPER-RESOLUTION
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基于白光干涉的光学透镜表面瑕疵检测
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作者 杨经裕 林绍莹 +2 位作者 王卫华 陈建玲 杨洪钦 《福光技术》 2023年第2期50-56,共7页
白光干涉在光学系统成像质量评价和光学元器件质量监控中扮演重要角色。相移干涉法通过测量光波的相位差获取被测透镜表面的形貌信息。本研究基于相移干涉原理,设计并实现了一套白光干涉检测系统,系统主要包括显微干涉光路、机械支撑、... 白光干涉在光学系统成像质量评价和光学元器件质量监控中扮演重要角色。相移干涉法通过测量光波的相位差获取被测透镜表面的形貌信息。本研究基于相移干涉原理,设计并实现了一套白光干涉检测系统,系统主要包括显微干涉光路、机械支撑、运动结构以及数据获取与处理。最后利用光学薄透镜对系统的性能进行测试,验证了系统的检测范围与测量精度。结果表明,基于白光干涉的相移干涉法适用于光学元器件表面的瑕疵质量监测。 展开更多
关键词 光学透镜 表面瑕疵 白光干涉 移相干涉
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