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Revealing complex optical phenomena through vectorial metrics 被引量:5
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作者 Chao He Jintao Chang +17 位作者 Patrick S.Salter Yuanxing Shen Ben Dai Pengcheng Li Yihan Jin Samlan Chandran Thodik Mengmeng Li Aziz Tariq Jingyu Wang Jacopo Antonello Yang Dong Ji Qi jianyu lin Daniel S.Elson Min Zhang Honghui He Hui Ma Martin J.Booth 《Advanced Photonics》 SCIE EI CSCD 2022年第2期59-67,共9页
Advances in vectorial polarization-resolved imaging are bringing new capabilities to applications ranging from fundamental physics through to clinical diagnosis.Imaging polarimetry requires determination of the Muelle... Advances in vectorial polarization-resolved imaging are bringing new capabilities to applications ranging from fundamental physics through to clinical diagnosis.Imaging polarimetry requires determination of the Mueller matrix(MM)at every point,providing a complete description of an object’s vectorial properties.Despite forming a comprehensive representation,the MM does not usually provide easily interpretable information about the object’s internal structure.Certain simpler vectorial metrics are derived from subsets of the MM elements.These metrics permit extraction of signatures that provide direct indicators of hidden optical properties of complex systems,while featuring an intriguing asymmetry about what information can or cannot be inferred via these metrics.We harness such characteristics to reveal the spin Hall effect of light,infer microscopic structure within laser-written photonic waveguides,and conduct rapid pathological diagnosis through analysis of healthy and cancerous tissue.This provides new insight for the broader usage of such asymmetric inferred vectorial information. 展开更多
关键词 polarization imaging vectorial metrics Mueller matrix
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