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C-V characteristics of piezotronic metal-insulator-semiconductor transistor 被引量:3
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作者 jiayang zheng Yongli Zhou +2 位作者 Yaming Zhang Lijie Li Yan Zhang 《Science Bulletin》 SCIE EI CAS CSCD 2020年第2期161-168,88,共9页
Third generation semiconductors for piezotronics and piezo-phototronics,such as Zn O and Ga N,have both piezoelectric and semiconducting properties.Piezotronic devices normally exhibit high strain sensitivity because ... Third generation semiconductors for piezotronics and piezo-phototronics,such as Zn O and Ga N,have both piezoelectric and semiconducting properties.Piezotronic devices normally exhibit high strain sensitivity because strain-induced piezoelectric charges control or tune the carrier transport at junctions,contacts and interfaces.The distribution width of piezoelectric charges in a junction is one of important parameters.Capacitance-voltage(C-V)characteristics can be used to estimate the distribution width of strain-induced piezoelectric charges.Piezotronic metal–insulator-semiconductor(MIS)has been modelled by analytical solutions and numerical simulations in this paper,which can serve as guidance for C-V measurements and experimental designs of piezotronic devices. 展开更多
关键词 Piezotronic effect Capacitance-voltage(C-V)characteristics METAL-INSULATOR-SEMICONDUCTOR Distribution WIDTH of strain-induced piezoelectric CHARGES
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