期刊文献+
共找到2篇文章
< 1 >
每页显示 20 50 100
Numerical study via total Lagrangian smoothed particle hydrodynamics on chip formation in micro cutting 被引量:1
1
作者 jin-shi wang Xiao-Dong Zhang Feng-Zhou Fang 《Advances in Manufacturing》 SCIE CAS CSCD 2020年第2期144-159,共16页
Numerical simulation is an effective approach in studying cutting mechanism.The widely used methods for cutting simulation include finite element analysis and molecular dynamics.However,there exist some intrinsic shor... Numerical simulation is an effective approach in studying cutting mechanism.The widely used methods for cutting simulation include finite element analysis and molecular dynamics.However,there exist some intrinsic shortcomings when using a mesh-based formulation,and the capable scale of molecular dynamics is extremely small.In contrast,smoothed particle hydrodynamics(SPH)is a candidate to combine the advantages of them.It is a particle method which is suitable for simulating the large deformation process,and is formulated based on continuum mechanics so that large scale problems can be handled in principle.As a result,SPH has also become a main way for the cutting simulation.Since some issues arise while using conventional SPH to handle solid materials,the total Lagrangian smoothed particle hydrodynamics(TLSPH)is developed.But instabilities would still occur during the cutting,which is a critical issue to resolve.This paper studies the effects of TLSPH settings and cutting model parameters on the numerical instability,as well as the chip formation process.Plastic deformation,stress field and cutting forces are analyzed as well.It shows that the hourglass coefficient,critical pairwise deformation and time step are three important parameters to control the stability of the simulation,and a strategy on how to adjust them is provided. 展开更多
关键词 CUTTING Total Lagrangian smoothed particle hydrodynamics(TLSPH) Numerical instability Chip formation
原文传递
Material removal at atomic and close-to-atomic scale by highenergy photon:a case study using atomistic-continuum method
2
作者 Hao-Jie An jin-shi wang Feng-Zhou Fang 《Advances in Manufacturing》 SCIE EI CAS CSCD 2022年第1期59-71,共13页
Extreme ultraviolet(EUV)light plays an important role in various fields such as material characterization and semiconductor manufacturing.It is also a potential approach in material fabrication at atomic and close-to-... Extreme ultraviolet(EUV)light plays an important role in various fields such as material characterization and semiconductor manufacturing.It is also a potential approach in material fabrication at atomic and close-to-atomic scales.However,the material removal mechanism has not yet been fully understood.This paper studies the interaction of a femtosecond EUV pulse with monocrystalline silicon using molecular dynamics(MD)coupled with a two-temperature model(TTM).The photoionization mechanism,an important process occurring at a short wavelength,is introduced to the simulation and the results are compared with those of the traditional model.Dynamical processes including photoionization,atom desorption,and laser-induced shockwave are discussed under various fluencies,and the possibility of single atomic layer removal is explored.Results show that photoionization and the corresponding bond breakage are the main reasons of atom desorption.The method developed can be further employed to investigate the interaction between high-energy photons and the material at moderate fluence. 展开更多
关键词 Extreme ultraviolet(EUV) Molecular dynamics(MD) Two-temperature model(TTM)Photoionization Atomic and close-to-atomic scale manufacturing(ACSM)
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部