期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
Direct bandgap germanium-on-silicon inferred from 5.7% <100> uniaxial tensile strain [Invited] 被引量:5
1
作者 David S.Sukhdeo Donguk Nam +2 位作者 ju-hyung kang Mark L.Brongersma Krishna C.Saraswat 《Photonics Research》 SCIE EI CAS 2014年第3期S0008-S0013,共6页
We report uniaxial tensile strains up to 5.7%along h100i in suspended germanium(Ge)wires on a silicon substrate,measured using Raman spectroscopy.This strain is sufficient to make Ge a direct bandgap semiconductor.The... We report uniaxial tensile strains up to 5.7%along h100i in suspended germanium(Ge)wires on a silicon substrate,measured using Raman spectroscopy.This strain is sufficient to make Ge a direct bandgap semiconductor.Theoretical calculations show that a significant fraction of electrons remain in the indirect conduction valley despite the direct bandgap due to the much larger density of states;however,recombination can nevertheless be dominated by radiative direct bandgap transitions if defects are minimized.We then calculate the theoretical efficiency of direct bandgap Ge LEDs and lasers.These strained Ge wires represent a direct bandgap Group IV semiconductor integrated directly on a silicon platform. 展开更多
关键词 spectroscopy. STRAIN bandgap
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部