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Adaptive semi-empirical model for non-contact atomic force microscopy
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作者 Xi Chen jun-kai tong Zhi-Xin Hu 《Chinese Physics B》 SCIE EI CAS CSCD 2022年第8期682-687,共6页
Non-contact atomic force microscope is a powerful tool to investigate the surface topography with atomic resolution.Here we propose a new approach to estimate the interaction between its tips and samples,which combine... Non-contact atomic force microscope is a powerful tool to investigate the surface topography with atomic resolution.Here we propose a new approach to estimate the interaction between its tips and samples,which combines a semi-empirical model with density functional theory(DFT)calculations.The generated frequency shift images are consistent with the experiment for mapping organic molecules using CuCO,Cu,CuCl,and CuO_(x)tips.This approach achieves accuracy close to DFT calculation with much lower computational cost. 展开更多
关键词 semi-empirical model atomic force microscopy density functional theory functionalized tips
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