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Revealing the inhomogeneous surface chemistry on the spherical layered oxide polycrystalline cathode particles
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作者 蒋之森 李少锋 +6 位作者 许正瑞 Dennis Nordlund Hendrik Ohldag Piero Pianetta jun-sik lee 林锋 刘宜晋 《Chinese Physics B》 SCIE EI CAS CSCD 2020年第2期81-86,共6页
The hierarchical structure of the composite cathodes brings in significant chemical complexity related to the interfaces,such as cathode electrolyte interphase.These interfaces account for only a small fraction of the... The hierarchical structure of the composite cathodes brings in significant chemical complexity related to the interfaces,such as cathode electrolyte interphase.These interfaces account for only a small fraction of the volume and mass,they could,however,have profound impacts on the cell-level electrochemistry.As the investigation of these interfaces becomes a crucial topic in the battery research,there is a need to properly study the surface chemistry,particularly to eliminate the biased,incomplete characterization provided by techniques that assume the homogeneous surface chemistry.Herein,we utilize nano-resolution spatially-resolved x-ray spectroscopic tools to probe the heterogeneity of the surface chemistry on LiNi0.8Mn0.1Co0.1O2 layered cathode secondary particles.Informed by the nano-resolution mapping of the Ni valance state,which serves as a measurement of the local surface chemistry,we construct a conceptual model to elucidate the electrochemical consequence of the inhomogeneous local impedance over the particle surface.Going beyond the implication in battery science,our work highlights a balance between the high-resolution probing the local chemistry and the statistical representativeness,which is particularly vital in the study of the highly complex material systems. 展开更多
关键词 Ni-rich CATHODE x-ray NANOPROBE redox heterogeneity surface chemistry
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Reliability of flip-chip bonded RFID die using anisotropic conductive paste hybrid material 被引量:1
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作者 jun-sik lee Jun-Ki KIM +2 位作者 Mok-Soon KIM Namhyun KANG Jong-Hyun lee 《Transactions of Nonferrous Metals Society of China》 SCIE EI CAS CSCD 2011年第A01期175-181,共7页
A reliability of flip-chip bonded die as a function of anisotropic conductive paste (ACP) hybrid materials, bonding conditions, and antenna pattern materials was investigated during the assembly of radio frequency ide... A reliability of flip-chip bonded die as a function of anisotropic conductive paste (ACP) hybrid materials, bonding conditions, and antenna pattern materials was investigated during the assembly of radio frequency identification(RFID) inlay. The optimization condition for flip-chip bonding was determined from the behavior of bonding strength. Under the optimized condition, the shear strength for the antenna printed with paste-type Ag ink was larger than that for Cu antenna. Furthermore, an identification distance was varied from the antenna materials. Comparing with the Ag antenna pattern, the as-bonded die on Cu antenna showed a larger distance of identification. However, the long-term reliability of inlay using the Cu antenna was decreased significantly as a function of aging time at room temperature because of the bended shape of Cu antenna formed during the flip-chip bonding process. 展开更多
关键词 可靠性调查 混合材料 倒装芯片 各向异性 RFID 导电膏 无线电频率识别 天线方向图
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