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SOD Stack Low-k Integration for 45 nm Node and Beyond
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作者 k. Maekawa H. Nagai +10 位作者 M. Iwashita M. Muramatsu k. kubota k. Hinata A.Shiota T. kokubo M. Hattori k. mishima H. Nagano M. kodera k. Tokushige 《电子工业专用设备》 2005年第3期69-73,共5页
We investigated single damascene integration with Porous MSQ (Methyl-Silsesqui-oxane, k value is 2.3) and Spin on Low k MSQ (k value is 2.9) as hard mask on Porous MSQ. Mechanical property of Low k material is improve... We investigated single damascene integration with Porous MSQ (Methyl-Silsesqui-oxane, k value is 2.3) and Spin on Low k MSQ (k value is 2.9) as hard mask on Porous MSQ. Mechanical property of Low k material is improved by Electron Beam (EB) Cure technology. And also One time cure of stacked Low k is successful without any problem. On integration issue of Low k material, we demonstrated low damage resist strip process by using reducing gas chemistry and clarified mechanism of new Cu corrosion mode during CMP process. 展开更多
关键词 SOD 低K值 节点 MSQ CMP
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