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Strain effect on the electronic properties of III-nitride nanosheets:Ab-initio study 被引量:1
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作者 GHASEMZADEH Farzaneh kanjouri faramarz 《Science China(Technological Sciences)》 SCIE EI CAS CSCD 2018年第4期535-541,共7页
In this study the structural and electronic properties of III-nitride monolayers XN(X=B, Al, Ga and In) under different percentages of homogeneous and shear strain are investigated using the full potential linearized ... In this study the structural and electronic properties of III-nitride monolayers XN(X=B, Al, Ga and In) under different percentages of homogeneous and shear strain are investigated using the full potential linearized augmented plane wave within the density functional theory. Geometry optimizations indicate that GaN and InN monolayers get buckled under compressive strain.Our calculations show that the free-strains of these four monolayers have an indirect band gap. By applying compressive biaxial strain, a transition from indirect to direct band gap occurs for GaN and InN, while the character of band gap for BN and AlN is not changed. Under tensile strain, only BN monolayer behaves as direct band gap semiconductor. In addition, when the shear strain is applied, only InN undergoes an indirect to direct band gap transition. Furthermore, the variations of band gap versus strain for III-nitride monolayers have been calculated. When a homogeneous uniform strain, in the range of [.10%, +10%], is applied to the monolayers, the band gap can be tuned for from 3.92 eV to 4.58 eV for BN, from 1.67 eV to 3.46 eV for AlN, from0.24 eV to 2.79 eV for GaN and from 0.60 eV to 0.90 eV for InN. 展开更多
关键词 Ab-initio 电子性质 III 氮化物 学习 ALN EV 单层
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