期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
Impact of barrier thickness on gate capacitance—modeling and comparative analysis of GaN based MOSHEMTs 被引量:2
1
作者 kanjalochan jena Raghunandan Swain T.R.Lenka 《Journal of Semiconductors》 EI CAS CSCD 2015年第3期60-64,共5页
A mathematical model is developed predicting the behavior of gate capacitance with the nanoscale variation of barrier thickness in AlN/GaN MOSHEMT and its effect on gate capacitances of AIInN/GaN and AlGaN/GaN MOSHEMT... A mathematical model is developed predicting the behavior of gate capacitance with the nanoscale variation of barrier thickness in AlN/GaN MOSHEMT and its effect on gate capacitances of AIInN/GaN and AlGaN/GaN MOSHEMTs through TCAD simulations is compared analytically. AlN/GaN and AIInN/GaN MOSHEMTs have an advantage of a significant decrease in gate capacitance up to 108 fF/μm^2 with an increase in barrier thickness up to 10 nm as compared to conventional AlGaN/GaN MOSHEMT. This decrease in gate capacitance leads to improved RF performance and hence reduced propagation delay. 展开更多
关键词 2DEG GAN MOSHEMT quantum capacitance TCAD
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部