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A Review of the Study on the Electromigration and Power Electronics
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作者 Md. Khalilur Rahman Abul Monsur Mohammed Musa +3 位作者 Budrun Neher kawchar ahmed patwary Mohammad Atiqur Rahman Md. Shariful Islam 《Journal of Electronics Cooling and Thermal Control》 2016年第1期19-31,共13页
Electromigration is a main challenge in the pursuit of power electronics, because physical limit to increase current density in power electronics is electromigration (EM), whereas much higher electrical current and vo... Electromigration is a main challenge in the pursuit of power electronics, because physical limit to increase current density in power electronics is electromigration (EM), whereas much higher electrical current and voltage are required for power electronics packaging. So the effect of EM is an important issue in applications where high current densities are used, such as in microelectronics and related structures (e.g., Power ICs). Since the structure size of integrated circuits (ICs) decreases and the practical significance of this effect increases, the result is EM failure. On the other hand, in the next generation power electronics technology electrical current density is expected to exceed 10<sup>7</sup> A/cm<sup>2</sup> which is another challenge. This review work has been carried out to identify the mechanism of EM damage in power electronics (e.g., pure metallization and solder joints) and also how to control this kind of damage. 展开更多
关键词 Voids and Hillocks INTERCONNECT Solder Joint Thermomigration MTF Reliability of IC
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