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Production of highly charged argon ions from a room temperature electron beam ion trap
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作者 王铁山 彭海波 +4 位作者 Ovsyannikov V P kentsch u ullmann F 程锐 Zschornack G 《Chinese Physics C》 SCIE CAS CSCD 北大核心 2008年第5期389-392,共4页
In this work, highly charged ions have been extracted from the advanced Electron Beam Ion Source (EBIS-A) developed in a scientific cooperation between the Dresden University of Technology and the DREEBIT GmbH Dresd... In this work, highly charged ions have been extracted from the advanced Electron Beam Ion Source (EBIS-A) developed in a scientific cooperation between the Dresden University of Technology and the DREEBIT GmbH Dresden. The charge state distributions of ions extracted from the EBIS-A are measured in the pulse and leaky modes under different operation conditions. Aris+ ions with current of 2 pA are produced and extracted in the leaky mode. 3×10^5 Ar^18+ ions per pulse are extracted in the pulse mode. The ion charge state distribution is a function of the ionization time. 展开更多
关键词 EBIS highly charged ion ionization time
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