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QTL Mapping for Partial Resistance to Southern Corn Rust Using RILs of Tropical Sweet Corn 被引量:9
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作者 kitti wanlayaporn Jetsada Authrapun +1 位作者 Apichat Vanavichit Somvong Tragoonrung 《American Journal of Plant Sciences》 2013年第4期878-889,共12页
Southern corn rust is one of destructive diseases in maize caused by Puccinia polysora Undrew. A mapping population of tropical sweet corn recombinant inbred lines (RILs) derived from a cross between hA9104 and hA9035... Southern corn rust is one of destructive diseases in maize caused by Puccinia polysora Undrew. A mapping population of tropical sweet corn recombinant inbred lines (RILs) derived from a cross between hA9104 and hA9035 inbred lines were set up to detect quantitative trait loci (QTLs) involved in partial resistance to southern corn rust. Eighty nine RILs were used to evaluate resistance levels using nine-point relative scale (1-9) at Sweet Seeds, Suwan Farm, Thailand include combined analysis. A genetic linkage map was constructed with 157 SSR markers, with a total length of 2123.1 cM, covering 10 chromosomes. Broad-sense heritability of individual location ranged from 0.76 and 0.82 and combined across locations was 0.87. Multiple QTL mapping (MQM) was applied for the identification of the QTLs. Fifteen QTLs were detected on chromosome 1, 2, 5, 6, 9 and 10 in both locations and combined across locations. QTLs on chromosome 1, 5 and 6 were contributed by alleles of resistant parent hA9104 while others were contributed by alleles from the susceptible parent, hA9035. Phenotypic variance of each QTL explained ranged from 6.1% to 41.8% with a total of 69.8% - 81.9%. QTL on chromosome 1, 6 and 10 were stable QTLs detected in both locations. 展开更多
关键词 Sweet CORN Southern CORN RUST Partial Resistance Quantitative TRAIT LOCI (QTLs) Combined across Locations
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