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REVEALING MICROSTRUCTURE OF FINE PARTICLES BY TEM 被引量:3
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作者 KemingFang ZhengLin +1 位作者 kunfang LangHuang 《China Particuology》 SCIE EI CAS CSCD 2003年第2期88-90,共3页
This paper introduces a method of cutting nano-scaled thin films from fine particles by using the technique of metal encapsulation. The interior morphology and microstructure of fine particles are then examined by TEM... This paper introduces a method of cutting nano-scaled thin films from fine particles by using the technique of metal encapsulation. The interior morphology and microstructure of fine particles are then examined by TEM or HREM. 展开更多
关键词 TEM 微观结构 微粒材料 材料性质 电子显微镜 纳米材料
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