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Fractal characteristics of far-field diffraction patterns for two-dimensional Thue-Morse quasicrystals
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作者 阳明仰 周骏 +2 位作者 l petti S De Nicola P Mormile 《Optoelectronics Letters》 EI 2011年第5期346-349,共4页
We report a numerical method to analyze the fractal characteristics of far-field diffraction patterns for two-dimensional Thue-Morse (2-D TM) structures. The far-field diffraction patterns of the 2-D TM structures can... We report a numerical method to analyze the fractal characteristics of far-field diffraction patterns for two-dimensional Thue-Morse (2-D TM) structures. The far-field diffraction patterns of the 2-D TM structures can be obtained by the numerical method, and they have a good agreement with the experimental ones. The analysis shows that the fractal characteristics of far-field diffraction patterns for the 2-D TM structures are determined by the inflation rule, which have potential applications in the design of optical diffraction devices. 展开更多
关键词 Diffraction patterns Fractals INTERFEROMETRY Two dimensional
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