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X-ray diffraction analysis of cold-worked Cu-Ni-Si and Cu-Ni-Si-Cr alloys by Rietveld method 被引量:3
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作者 A.KHEREDDINE F.HADJ LARBI +3 位作者 l.djebala H.AZZEDDINE B.ALILI D.BRADAI 《Transactions of Nonferrous Metals Society of China》 SCIE EI CAS CSCD 2011年第3期482-487,共6页
Cold worked and annealed supersaturated Cu-2.65Ni-0.6Si and Cu-2.35Ni-0.6Si-0.6Cr alloys were studied. The microstructural parameters evolution, including crystallite size, root mean square strain and dislocation dens... Cold worked and annealed supersaturated Cu-2.65Ni-0.6Si and Cu-2.35Ni-0.6Si-0.6Cr alloys were studied. The microstructural parameters evolution, including crystallite size, root mean square strain and dislocation density was analyzed using Materials Analysis Using Diffraction software (MAUD). The parameters for both alloys have typical values of cold deformed and subsequently annealed copper based alloy. A net change of the crystallite size, root mean square strain and dislocation density values of the alloys aged at 450 °C for 2.5-3 h seems corresponding to the recovery and recrystallization processes. Addition of Cr as quaternary element did not lead to any drastic changes of post deformation or ageing microstructural parameters and hence of recovery-recrystallization kinetics. 展开更多
关键词 Cu-Ni-Si alloy microstructure XRD line profile analysis Materials Analysis Using Diffraction software
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