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Extremely Narrow Sb Delta-Doped Epitaxial Layer Characterized by X-Ray Reflectivity
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作者 蒋最敏 修立松 +5 位作者 姜晓明 郑文莉 卢学坤 朱海军 张翔九 王迅 《Chinese Physics Letters》 SCIE CAS CSCD 1997年第9期686-689,共4页
An Sb delta doping layer in silicon is grown at the temperature of 300℃ by silicon molecular beam epitaxy and characterized by the small angle x-ray reflectivity measurement using synchrotron radiation beam.The oscil... An Sb delta doping layer in silicon is grown at the temperature of 300℃ by silicon molecular beam epitaxy and characterized by the small angle x-ray reflectivity measurement using synchrotron radiation beam.The oscillations of the reflectivity caused by dopant Sb at Q as large as 14.5 are detected.Simulation of this curve as a whole shows that the total amount of dopant Sb is 0.15 monolayer and is restricted to two atomic layers.An extremely narrow Sb delta doping structure without Sb segregation is thus obtained at the growth temperature of 300℃ as verified by the experiment. 展开更多
关键词 DOPANT REFLECTIVITY DOPING
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SiGe Optical Waveguide Modulators Based on the Plasma Dispersion Effect
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作者 GAO Yong LI Guo-zheng +4 位作者 LIU Xi-ding LIU En-ke ZHANG Xiang-jiu lu xue-kun WANG Xun 《Chinese Physics Letters》 SCIE CAS CSCD 1996年第3期189-191,共3页
Based on plasma dispersion of Si_(1-x)Ge_(x),the single mode waveguide modulators consisting of Si_(1-x)Ge_(x)/Si and Si/Si_(1-x)Ge_(x)/Si which were grown by molecular beam epitaxy have been fabricated.For Si_(1-x)Ge... Based on plasma dispersion of Si_(1-x)Ge_(x),the single mode waveguide modulators consisting of Si_(1-x)Ge_(x)/Si and Si/Si_(1-x)Ge_(x)/Si which were grown by molecular beam epitaxy have been fabricated.For Si_(1-x)Ge_(x)/Si structure,the switch current and insertion loss at wavelength 1.3 fiin are 36 mA and 2.8 dB,respectively.The switching response time is 40 ns. 展开更多
关键词 WAVEGUIDE WAVEGUIDE SIGE
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