This paper presents an algorithm for blind recognition of punctured convo-lutional codes which is an important problem in adaptive modulation and coding. For a given finite sequence of convolutional code, the parity c...This paper presents an algorithm for blind recognition of punctured convo-lutional codes which is an important problem in adaptive modulation and coding. For a given finite sequence of convolutional code, the parity check matrix of the convolutional code is first computed by solving a linear system with adequate error tolerance. Then a minimal basic encoding matrix of the original convolutional code and its puncturing pattern are determined according to the known parity check matrix of the punctured convolutional code.展开更多
Human faces have two important characteristics: (1) They are similar objectsand the specific variations of each face are similar to each other; (2) They are nearly bilateralsymmetric. Exploiting the two important prop...Human faces have two important characteristics: (1) They are similar objectsand the specific variations of each face are similar to each other; (2) They are nearly bilateralsymmetric. Exploiting the two important properties, we build a unified model in identity subspace(UMIS) as a novel technique for face recognition from only one example image per person. An identitysubspace spanned by bilateral symmetric bases, which compactly encodes identity information, ispresented. The unified model, trained on an obtained training set with multiple samples per classfrom a known people group A, can be generalized well to facial images of unknown individuals, andcan be used to recognize facial images from an unknown people group B with only one sample persubject, Extensive experimental results on two public databases (the Yale database and the Berndatabase) and our own database (the ICT-JDL database) demonstrate that the UMIS approach issignificantly effective and robust for face recognition.展开更多
VLSI testing is being pushed to the high-level based technology. In thispaper a Verilog Register transfer level Model (VRM) for integrated circuits is proposed. The modelprovides a text format file, which is convenien...VLSI testing is being pushed to the high-level based technology. In thispaper a Verilog Register transfer level Model (VRM) for integrated circuits is proposed. The modelprovides a text format file, which is convenient and more practical for developing succeedingRegister Transfer Level (RTL) test tools, such as fault simulation, test pattern generation and soforth. Based on the VRM, an RTL concurrent fault simulation approach is presented. After RTL faultmodels and super faults defined, the concurrent fault simulation algorithm is given. Thecorresponding RTL concurrent fault simulator, VFSim, was implemented. The initial experiments showthat the RTL fault simulator is efficient for VLSI circuits.展开更多
基金the National Namral Science Foundation of China(Grant Nos.10171017,90204013)Special Funds ofAuthorsofExcellentDoctoralDissertationinChina(GrantNo.200084) Shanghai Science and Technology Funds(Grant No.0351 1501)
文摘This paper presents an algorithm for blind recognition of punctured convo-lutional codes which is an important problem in adaptive modulation and coding. For a given finite sequence of convolutional code, the parity check matrix of the convolutional code is first computed by solving a linear system with adequate error tolerance. Then a minimal basic encoding matrix of the original convolutional code and its puncturing pattern are determined according to the known parity check matrix of the punctured convolutional code.
文摘Human faces have two important characteristics: (1) They are similar objectsand the specific variations of each face are similar to each other; (2) They are nearly bilateralsymmetric. Exploiting the two important properties, we build a unified model in identity subspace(UMIS) as a novel technique for face recognition from only one example image per person. An identitysubspace spanned by bilateral symmetric bases, which compactly encodes identity information, ispresented. The unified model, trained on an obtained training set with multiple samples per classfrom a known people group A, can be generalized well to facial images of unknown individuals, andcan be used to recognize facial images from an unknown people group B with only one sample persubject, Extensive experimental results on two public databases (the Yale database and the Berndatabase) and our own database (the ICT-JDL database) demonstrate that the UMIS approach issignificantly effective and robust for face recognition.
文摘VLSI testing is being pushed to the high-level based technology. In thispaper a Verilog Register transfer level Model (VRM) for integrated circuits is proposed. The modelprovides a text format file, which is convenient and more practical for developing succeedingRegister Transfer Level (RTL) test tools, such as fault simulation, test pattern generation and soforth. Based on the VRM, an RTL concurrent fault simulation approach is presented. After RTL faultmodels and super faults defined, the concurrent fault simulation algorithm is given. Thecorresponding RTL concurrent fault simulator, VFSim, was implemented. The initial experiments showthat the RTL fault simulator is efficient for VLSI circuits.
