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Measuring the Interfacial Thickness of Immiscible Polymer Blends by Nano-probing of Atomic Force Microscopy
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作者 Tian-Tian Li Si-Bo Cheng +3 位作者 lian-fang feng Xue-Ping Gu Cai-Liang Zhang Guo-Hua Hu 《Chinese Journal of Polymer Science》 SCIE EI CAS CSCD 2022年第4期421-430,共10页
Immiscible polymer blends are an important family of polymer materials.The interfacial thickness between different phases is a very important parameter that dictates,to a great extent,the morphology and properties of ... Immiscible polymer blends are an important family of polymer materials.The interfacial thickness between different phases is a very important parameter that dictates,to a great extent,the morphology and properties of such a blend.This work explores and optimizes an up-to-date atomic force microscopy(AFM)of type NanoIR2^(TM) system in order to quantitatively measure the interfacial thickness of immiscible polymer blends.This system is equipped with two nano-probes capable of detecting the response of a material to an infrared pulse called AFM-infrared spectroscopy mode(AFM-IR)or conducting resonance called AFM-Lorentz Contact Resonance mode(AFM-LCR),respectively.Its potential for quantitatively measuring the interfacial thickness of immiscible polymer blends is evaluated using blends composed of polyamide 6(PA6)and polyolefin elastomer(POE)in the presence or absence of a POE containing maleic anhydride(POE-g-MAH)as a compatibilizer.Surface roughness affects adversely the signal intensity and consequently an accurate measurement of the interfacial thickness.Optimum sample surface preparation procedures are proposed. 展开更多
关键词 Polymer blends Interfacial thickness Atomic force microscopy Nano-probing Surface roughness
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