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Bulk GaN-based SAW resonators with high quality factors for wireless temperature sensor
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作者 Hongrui Lv Xianglong Shi +6 位作者 Yujie Ai Zhe Liu Defeng Lin lifang jia Zhe Cheng Jie Yang Yun Zhang 《Journal of Semiconductors》 EI CAS CSCD 2022年第11期78-83,共6页
Surface acoustic wave(SAW)resonator with outstanding quality factors of 4829/6775 at the resonant/anti-resonant frequencies has been demonstrated on C-doped semi-insulating bulk GaN.The impact of device parameters inc... Surface acoustic wave(SAW)resonator with outstanding quality factors of 4829/6775 at the resonant/anti-resonant frequencies has been demonstrated on C-doped semi-insulating bulk GaN.The impact of device parameters including aspect ratio of length to width of resonators,number of interdigital transducers,and acoustic propagation direction on resonator performance have been studied.For the first time,we demonstrate wireless temperature sensing from 21.6 to 120℃ with a stable temperature coefficient of frequency of–24.3 ppm/℃ on bulk GaN-based SAW resonators. 展开更多
关键词 surface acoustic wave RESONATOR gallium nitride quality factor temperature sensor
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A review on the GaN-on-Si power electronic devices 被引量:1
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作者 Yaozong Zhong Jinwei Zhang +5 位作者 Shan Wu lifang jia Xuelin Yang Yang Liu Yun Zhang Qian Sun 《Fundamental Research》 CAS 2022年第3期462-475,共14页
The past decades have witnessed a tremendous development of GaN-based power electronic devices grown on Si substrate.This article provides a concise introduction,review,and outlook of the research developments of GaN-... The past decades have witnessed a tremendous development of GaN-based power electronic devices grown on Si substrate.This article provides a concise introduction,review,and outlook of the research developments of GaN-on-Si power device technology.The comprehensive review has discussed the crucial issues in the state-of-the-art device technology based on both GaN materials epitaxy including stress control and point defects study,and device fabrication including normally offsolutions like Cascode,trench MIS-gate,and p-GaN gate.Device reliability and other common fabrication issues in GaN high electron mobility transistors(HEMTs)are also discussed.Lastly,we give an outlook on the GaN-on-Si power devices from two aspects,namely high frequency,and high power GaN ICs,and GaN vertical power devices. 展开更多
关键词 GaN-on-Si EPITAXY Power device Transistor Diode Enhancement mode
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